Target Tecnología, S.A.

Included by the American TSA in the List of Approved Technology for Air Cargo Inspection

An inspection system x-ray Dual View (Dual View) multi-purpose specially designed for airport checkpoints and other uses packet inspection at high risk. Dimension inspection tunnel: 651 mm x 454 mm

PC-based system

The XIS 6545DV is a PC based system that incorporates the latest electronic technology with a modular design improved. The XIS6545DV uses a high-speed computer that implements advanced complex algorithms in real time.

Multi-Purpose Design and Functional

The XIS-6545DV Dual use Technology Vista (Dual View) which allows the display of objects from two different perspectives, making an image of the object from bottom to top (vertical beam) and a side view (beam side). The result is greater ability to see hidden objects, which allows operators to identify potential threats faster and easier than conventional systems using single view. The tunnel size 651 mm x 454 mm System allows use in multiple applications and various security areas.

Physical Characteristics:

• Tunnel Inspection: 651 mm x 454 mm
• Dimensions: 2130mm x 1064 mm x 1290 mm
• Weight: 800 kg. approx

New Image Processing Features:

• Automatic Image Archive - up to 50,000 images
• Suspicious File Image selective
• Review of the latest 100 images scanned at will
• Automatic Measurement and Discrimination Z Atomic Number Materials
• New Palette 6 Color Images
• Programmable Penetration Levels
• Zoom user selectable up to x32
• Image Manipulation in Real Time
• Picture Mode Picture Perfect

Designed to work in Networks

The XIS 6545DV is designed to work networked with other inspection systems and can transmit high speed data via Ethernet. The images of the XIS 6545XD can be sent by network to a central server for processing and handling it.